Application Scenarios
Sub-Micron Level Measurement
Challenges: Material inconsistency, measurement interference from object variations, poor repeatability, and undetectable features.
Industries: Automotive, electronics, machinery, etc.
Micron-Level Measurement
Challenges: Lens distortion and product burrs/contour irregularities affect measurement accuracy.
Industries: Automotive, electronics, machinery, etc.
Typical Cases
Glass Chamfer Dimension Measurement
Wheel Hub Positioning & Dimensional Inspection
Product Pricing
